Raman spectroscopy and in situ X-ray diffraction W. Zhu, A. Paolella, C. Kim, D. Liu, Z. Feng, C. Gagnon, J. Trottier, A. Vijh, A.Guerfi, A. Mauger, C. ... Figure S2 XRD diffraction pattern of -sulfur powder and the lattice parameters obtained from Rietveld refinement. 0 100 200 300 400 500 600 700 800 R a m an S hift (cm-1)Web